XRF analysis is a technique routinely used in many laboratories around the world. Its advantages include a fast determination of the elemental composition of the samples with sample preparation procedures that might be very simple, thus avoiding the risks of contamination. Spectrometers can be classified depending on the principle of dispersion and detection of the characteristic x-rays as Energy Dispersive or Wavelength Dispersive.
The detection limits commonly achieved for the analysis of thin samples are within a few hundreds of ng/cm2 (for Mg) to a few ng/cm2 (for best excited elements, e.g. Zr excited by Mo-Ka). In the special case of Total reflection X-ray Fluorescence, the absolute detection limits for laboratory conditions are in the order of picograms, or ng/mL in solution.
NSIL is equipped with different configurations of instruments, thus making the laboratory an ideal hub for hands-on training. A description of the instruments available at the laboratory is provided in each of the links highlighted at the left menu.