Training in XRF
The training programs on XRF are tailored to the needs of the fellows, and the duration is from 8 to 14 weeks.
A combination of the following topics is possible:
- Introduction to X-ray Physics: Nature of X-rays, X-ray Interactions with Matter, Attenuation of X-rays, Principle of XRF analysis
- Instrumentation in XRF analysis: Types of XRF spectrometers, Comparison of performance, Excitation sources and exciting beam modifiers (filters, secondary targets, polarizers, x-ray optics, etc.), Detectors and Signal processing
- Statistics concepts and relevance for XRF: XRF spectra features and main interferences, Interpretation of XRF spectra, detection limits
- Introduction to Quantitative analysis: Fundamentals and comparison of possible approaches for quantification. Training in 1-2 of any of the following methods of choice:
- Analysis of thin samples: Elemental sensitivity and Linear Regression calibrations
- Analysis of samples of geological origin: Scatter-corrected calibrations to compensate for differences in attenuation effects
- Analysis of samples of major constituents in mineral samples: Sample dilution
- Analysis of samples of biological origin: Scatter based definition of matrix for attenuation corrections
- Trace analysis of liquid samples: Total Reflection XRF
- Analysis of metal alloys: Fundamental parameters and alpha coefficients
- Method validation according to EURACHEM MV guide, including a demonstration on how to assess the validity of factory-made calibrations (e.g. the ones sold with the instrument, if that is the case)
- Practical demonstrations using EDXRF and WDXRF instruments. Calibration and Validation
- Introduction to IAEA AXIL-QXAS, Practice on spectrum fitting and options for off-line analysis
- Internal quality control actions